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C3320TFT is an innovative test system for the latest LCD and TFT driver devices.
The open architecture is conceived for high pin count up to 2048 channels.
For each channel are available accurate V/I resources and DSP to fully satisfy complex test procedure as requested in the TFT driver technologies.
The C3320TFT is the top-notch solution where high accuracy, high speed and low cost of test are needed to succeed in the competitive market.

MAIN FEATURES

  • High performances at the lowest cost
  • Open architecture for future technologies by TRIM
  • Up to 2048 LCD TFT channels
  • Multisite test capabilities
  • High speed differential channels for RSDS & LVDS
  • Active load for 2048 channel synchronous with TFT / LCD pattern
  • TFT / LCD output pin threshold per pin programmable
  • Real time data processing
  • Fast test time

MAIN SPECIFICATIONS

  • Open architecture for future technologies by TRIM (LCD-TFT, OLED, PLASMA)
  • Up to 2048 channels LCD-TFT
  • LCD-TFT channel input voltage : +/- 40V
  • LCD-TFT channel current load : programmable up to +/- 4 mA (16 bit - 4 scale range : 4mA, 400uA, 40uA, 4uA)
  • LCD-TFT active load synchronous with digital pattern
  • Up to 32 high speed differential channels for RSDS & LVDS (250MHz)
  • Up to 64 Vgamma channels
  • V gamma channels output voltage : up to 40 V (16 bit - 4 current scale range : 40mA, 4mA, 400uA, 40uA)
  • V gamma channels per pin DVM (16 bit)
  • TFT / LCD output pin threshold per pin programmable (up to 40 V)
  • Multiple DSP for real time data processing
  • ATOS C2 System software for Multisite test

C3320TFT