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OVERVIEW
The Comptest MX is a mixed signal semiconductor test family.
The system performs parametric and functional tests on electronic analog, digital and mixed signal type components including the parallel testing of multiple devices (Multisite Test).

APPLICATIONS

  • Smart cards
  • Contactless Smart cards
  • MEMS
  • LCD controllers & driver
  • Multimedia
  • Car immobilizer
  • DECT
  • Telephone
  • Fiber optics driver/amps
  • TV & VCR tuners
  • DAC & ADC
  • Micro controllers
  • Automotive
  • Linears
  • Sensors
  • Transducers
  • Hybrids

MAIN FEATURES

  • High performances - Low cost
  • True per pin system architecture
  • Multisite test capability
  • RFID resources for contactless IC
  • Mixed signal resourced (up to 256 Ch)
  • LCD - TFT channels (up to 2048 Ch)
  • OLED - PLASMA channels (up to 2048 Ch)
  • RSDS - LVDS resources (up to 32 Ch)
  • Power resources (HV & High Current)
  • Windows based programming software

C372MX


C340MX


C322MX


C320MX